The FOSS XDS MultiVial™ Analyzer provides the next generation of dedicated NIR analysis for rapid non-destructive measurements of solids in vials.
With the XDS MultiVial Analyzer you can replace routine tests, reduce product hold time and virtually eliminate quarantine time. Composition or material identification testing is performed either in the laboratory or at-line, on samples in vials. The Analyzer supports acquisition of spectra in an unattended mode, freeing the operator to prepare other samples, analyze data, etc.
The versatile sampling mechanism of the MultiVial Analyzer offers a movable (X-Y) sampling platform, suitable for handling a tray of multiple vials. An integrated variable spot-size feature enables the sample illumination to be adjusted based on the diameter of the vials being used. The sample centering iris is provided for single sample analysis, while the optional coarse granular cell extends analysis to virtually any solid form from fine powders to coarse granular materials, pellets and flakes.
XDS NIR technology offers superior analyzer performance with increased sensitivity and instrument matching to enhance method development, minimize implementation time and ensure seamless method transferability.
The XDS MultiVial Analyzer offers:
- XDS NIR technology ensures ease-of-use and seamless method transferability
- Automated, unattended reflectance analysis of a tray of multiple vials (size of vials selected by user)
- Integrated variable spot-size for optimal sample illumination
- No sample preparation, no reagents, no waste
- Network-ready analyzer for centralized database management
- Hot-swappable modules - change modules in minutes with no compromise in performance
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